Scanning probe microscopy (SPM) encompasses a diverse range of techniques that enable the interrogation of surfaces with atomic-scale precision. These methods, including atomic force microscopy (AFM), ...

What is Scanning Ion Conductance Microscopy? Scanning Ion Conductance Microscopy (SICM) is a non-contact scanning probe microscopy technique that enables high-resolution imaging of living cells and ...

How a small molecule offers a new window into atomic-scale magnetism. (Nanowerk News) A Czech and Spanish-led research team has demonstrated the ability to distinguish subtle differences between ...

Scientists use scanning tunneling microscopy to understand how a material's electronic or magnetic properties relate to its structure on the atomic scale. When using this technique, however, they can ...

Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...

A technical paper titled “High-speed mapping of surface charge dynamics using sparse scanning Kelvin probe force microscopy” was published by researchers at Oak Ridge National Laboratory, (ORNL), ...

The roughness for the full image is already calculated and displayed, but a mask can be made to exclude certain areas from the roughness in the image. Click on the Mask Make button. This will make a ...

Scanning electron microscopy (SEM) is an electron-beam–based imaging method in which a focused, raster-scanned electron probe interacts with a specimen surface to generate signals such as secondary ...

Atoms measure roughly 0.1 nanometers across, a scale so small that scientists spent more than six decades developing instruments capable of resolving them with any clarity. The journey from the first ...