FIB-SEM enables precise, automated TEM lamella prep with expert insights from Zeiss and the Polish Academy of Sciences.
In recent decades, the preparation of samples for transmission electron microscopes has transformed, thanks to the introduction of focused ion beam (FIB) instruments. Known as either single-beam or ...
When thinking of celebrated technological innovations, it is perhaps rare that we consider the role of material scientists: the unsung heroes of advancement. Nonetheless, it is the great work of these ...
TEM lamella preparation is essential for almost any FIB-SEM user. Go beyond conventional TEM sample preparation with the ZEISS Crossbeam FIB-SEM. Users can maximize their productivity for TEM lamella ...
CASI houses the Thermo Scientific Helios 5 UX DualBeam Focus Ion Beam/Scanning Electron Microscope (FIB-SEM) to accelerate nanotechnology research and development at the University of Wyoming. This ...
The Hitachi FB-2000A FIB uses a beam of focused high-energy (30 kV) gallium ions to remove material in a very controlled manner from inorganic specimens. The FB-2000A is a single beam system; that is, ...
HILLSBORO, Ore., Nov. 7, 2019 /PRNewswire/ -- Thermo Fisher Scientific today announced the Thermo Scientific Aquilos 2 Cryo-FIB, a DualBeam system dedicated to the preparation of thin, ...
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