Electronic Design

Board-Level Qualification Testing for Rad-Hard MOSFET Packaging

High-reliability rad hard MOSFETs undergo extensive screening and quality conformance testing to ensure that devices perform to specification in the harshest environments. For Defense Logistics Agency ...
Electronic Design

Kit Evaluates MOSFETs, Gate Drivers Under Real Operating Conditions

Wolfspeed’s SpeedVal Kit platform enables testing of SiC devices, gate drivers, and controls at real operating conditions, allowing design engineers to transition to wide-bandgap semiconductors in ...
Business Wire

Toshiba Starts Test-Sample Shipments of a Bare Die 1200V SiC MOSFET with Low On-Resistance and High Reliability, for Use in Automotive Traction Inverters

KAWASAKI, Japan--(BUSINESS WIRE)--Toshiba Electronic Devices & Storage Corporation (“Toshiba”) has developed "X5M007E120," a bare die [1] 1200V silicon carbide (SiC) MOSFET for automotive traction ...
EDN

Scope software validates wide-bandgap devices

The wide-bandgap double pulse test (WBG-DPT) application from Tektronix automates key validation measurements on wide bandgap devices such as SiC and GaN MOSFETs. Running on the company’s 4/5B/6B ...
Seeking Alpha

Aehr Receives Order from New Customer for FOX-NP™ Multi-Wafer Test and Burn-in System for Silicon Carbide MOSFETs

FREMONT, Calif., Sept. 18, 2023 (GLOBE NEWSWIRE) -- Aehr Test Systems (AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced it has received an initial customer ...
Seeking Alpha

Aehr Announces New Customer and Initial Order for FOX-XP™ Multi-Wafer Test and Burn-in System for Volume Production of Silicon Carbide MOSFETs

FREMONT, Calif., June 01, 2023 (GLOBE NEWSWIRE) -- Aehr Test Systems (AEHR), a worldwide supplier of semiconductor test and production burn-in equipment, today announced a new silicon carbide ...