BENGALURU, India — ARM has set up a VLSI test lab at its design center here to analyze intellectual-property libraries and ARM physical IP, so as to correlate design to silicon behavior. Such activity ...
Description: Discusses different aspects of VLSI testing and formal verification of designs. Design and manufacturing defect models are introduced along with test generation and fault simulation ...
Power consumption has become a crucial concern in Built-In Self-Test (BIST) due to the switching activity in the Circuit Under-Test (CUT). In this paper, the authors present a novel method which aims ...
Imagine a world where the chips powering your smartphones, computers, and even cars are designed and tested with unparalleled precision and speed. Welcome to the realm of Very Large Scale Integration ...
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