Abstract: This work assesses and analyzes negative-capacitance CFETs (NC-CFETs) with metal-ferroelectric-insulator-semiconductor (MFIS) and metal-ferroelectric-metal-insulator-semiconductor (MFMIS) ...
Abstract: While Gan-FET enables the miniaturization and increased efficiency of power modules, its low threshold voltage increases the likelihood of malfunctions. Additionally, the occurrence of ...